CE 0.4μM 11mJ Leeb Portable Hardness Tester

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CE 0.4μM 11mJ Leeb Portable Hardness Tester

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CE 0.4μM 11mJ Leeb Portable Hardness Tester

Impact Device Optional C Impact Probe hardness test device Leeb hardness tester C Impact Device size: Size: F20 *141mm, weight :75g. Minimum impact energy, used to measure small light, thin components ...

Product Tags:

11mj leeb portable hardness tester

0.4μm leeb portable hardness tester

C leeb hardness tester

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